Schafft, H.
(1968),
A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.445
(Accessed January 15, 2025)
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A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967:
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- NBS TN 445
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NBS TN 445
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NIST Pubs
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Created January 1, 1968, Updated May 19, 2023