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PUBLICATIONS

Calibration of dynamic sensors for noncontact-atomic force microscopy

Published

Author(s)

Gordon A. Shaw, Jon R. Pratt, Zeina J. Kubarych

Abstract

Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning fork-type sensors. The method eliminates uncertainties due to tip location, provides for direct calibration in ambient, liquid, ultrahigh vacuum (UHV), and cryogenic environments, and offers a route to measurements potentially traceable to the International System of Units (SI). The spring constants obtained with the dynamic calibration method agree with a traceable measurement made using instrumented indentation [1].
Proceedings Title
Proceedings of the Workshop on SPM Standardization, NCAFM 2010
Conference Dates
August 2-6, 2010
Conference Location
Kanizawa
Conference Title
NCAFM 2010
Pub Type
Conferences

Keywords

atomic force microscopy, small mass, spring constant, calibration, nanotechnology
Force metrology and Mass metrology

Citation

Shaw, G. , Pratt, J. and Kubarych, Z. (2011), Calibration of dynamic sensors for noncontact-atomic force microscopy, Proceedings of the Workshop on SPM Standardization, NCAFM 2010, Kanizawa, -1 (Accessed October 31, 2024)

Issues

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Created August 12, 2011, Updated February 19, 2017