Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Characterization and Calibration of Lightpipe Radiation Thermometers for Use in Rapid Thermal Processing

Published

Author(s)

Benjamin K. Tsai, D P. DeWitt

Abstract

Lightpipe radiation thermometers (LPRTs) are the sensor of choice for temperature measurements in Rapid Thermal Processing (RTP) applications. At the National Institute of Standards and Technology (NIST), we have developed protocols for calibrating and characterizing LPRTs for use in RTP and other applications. In this paper, the LPRTs and the sodium heat pipe blackbody (Na-HPBB) used in the calibration process at NIST will be introduced. The calibration and characterization methods (spatial response, spectral response, temporal response, and optical inspection) of the LPRTs will be described also. Finally, a discussion of the application of LPRTs in an environment outside of the calibration laboratory, along with a list of recommendations for proper use of LPRTs, will be presented.
Proceedings Title
Temperature, International Symposium | Eighth | Temperature: Its Measurement and Control in Science and Industry | AIP
Volume
684
Issue
Pt. 1
Conference Dates
October 21-24, 2002
Conference Title
AIP Conference Proceedings

Keywords

blackbody, calibration, characterization, lightpipe fradiation thermometer, radiometeric temperature, rapid thermal processing, sodium heat pipe

Citation

Tsai, B. and DeWitt, D. (2003), Characterization and Calibration of Lightpipe Radiation Thermometers for Use in Rapid Thermal Processing, Temperature, International Symposium | Eighth | Temperature: Its Measurement and Control in Science and Industry | AIP (Accessed December 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 1, 2003, Updated February 17, 2017