Souders, T.
and Stenbakken, G.
(1990),
A Comprehensive Approach for Testing Analog and Mixed-Signal Devices, Proc. 1990 Intl. Test Conference, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18012
(Accessed December 26, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Comprehensive Approach for Testing Analog and Mixed-Signal Devices
Published
Author(s)
,
Proceedings Title
Proc. 1990 Intl. Test Conference
Conference Dates
September 10-12, 1990
Conference Location
Washington, DC
Pub Type
Conferences
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 31, 1990, Updated October 12, 2021