Mattis, R.
, Till, L.
and Frisch, R.
(1982),
A computer program for analysis of data from microelectronic test structures:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.82-2492
(Accessed October 31, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A computer program for analysis of data from microelectronic test structures:
Published
Author(s)
, ,
Citation
- NBS IR 82-2492
Report Number
NBS IR 82-2492
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1982, Updated May 19, 2023