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Conductive Nanotube-based Scanning Probe Microscopy Applications

Published

Author(s)

Paul McClure, Vladimir Mancevski, Joseph Kopanski, Ilona Sitnitsky, Vincent LaBella, Kathleen Dunn, Matthew D. Bresin, Phillip D. Rack, Victor H. Vartanian
Citation
International SEMATECH Manufacturing Initiative Confidential

Citation

McClure, P. , Mancevski, V. , Kopanski, J. , Sitnitsky, I. , LaBella, V. , Dunn, K. , Bresin, M. , Rack, P. and Vartanian, V. (2010), Conductive Nanotube-based Scanning Probe Microscopy Applications, International SEMATECH Manufacturing Initiative Confidential, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907145 (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 29, 2010, Updated October 14, 2021