Caplins, B.
, Keller, B.
and Holm, J.
(2018),
Developing a Programmable STEM Detector for the Scanning Electron Microscope, Microscopy and Microanalysis, Baltimore, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925363
(Accessed October 31, 2024)