Caplins, B.
, Keller, B.
and Holm, J.
(2018),
Developing a Programmable STEM Detector for the Scanning Electron Microscope, Microscopy and Microanalysis, Baltimore, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925363
(Accessed December 26, 2024)
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Developing a Programmable STEM Detector for the Scanning Electron Microscope
Published
Author(s)
Benjamin Caplins, , Jason Holm
Abstract
This is an extended abstract for the 2018 Microscopy and Microanalysis meeting.Proceedings Title
Microscopy and Microanalysis
Conference Dates
August 5-9, 2018
Conference Location
Baltimore, MD, US
Pub Type
Conferences
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Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 31, 2018, Updated April 19, 2022