Caplins, B.
, Keller, B.
and Holm, J.
(2018),
Developing a Programmable STEM Detector for the Scanning Electron Microscope, Microscopy and Microanalysis, Baltimore, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925363
(Accessed October 31, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Developing a Programmable STEM Detector for the Scanning Electron Microscope
Published
Author(s)
Benjamin Caplins, , Jason Holm
Abstract
This is an extended abstract for the 2018 Microscopy and Microanalysis meeting.Proceedings Title
Microscopy and Microanalysis
Conference Dates
August 5-9, 2018
Conference Location
Baltimore, MD, US
Pub Type
Conferences
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 31, 2018, Updated April 19, 2022