Baker-Jarvis, J.
and Jones, C.
(1995),
Dielectric Measurements on Printed-Wiring and Circuit Boards, Thin Films, and Substrates: An Overview, Proc., Mater. Res. Soc. Symp. , San Francisco, CA
(Accessed December 21, 2024)
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Dielectric Measurements on Printed-Wiring and Circuit Boards, Thin Films, and Substrates: An Overview
Published
Author(s)
, Chriss A. Jones
Proceedings Title
Proc., Mater. Res. Soc. Symp.
Conference Dates
April 18, 1995
Conference Location
San Francisco, CA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 1995, Updated October 12, 2021