Effect of Capping Material on Interfacial Ferromagnetism in FeRh Thin Films

Published

January 31, 2014

Author(s)

C. Baldasseroni, G. K. Palsson, C. Bordel, S. Valencia, A. A. Unal, F. Kronast, S. Nemsak, C. S. Fadley, Julie Borchers, Brian B. Maranville, F. Hellman

Abstract

The role of the capping material in stabilizing a thin ferromagnetic layer at the interface between an FeRh film and cap in the nominally antiferromagnetic phase at room temperature was studied by x-ray magnetic circular dichroism in photoemission electron microscopy and polarized neutron reflectivity. These techniques were used to determine the presence or absence of interfacial ferromagnetism (FM) in films capped with oxides and metals. Chemically stable oxide caps do not generate any interfacial FM while the effect of metallic caps depends on the element, showing that interfacial FM is due to metallic interdiffusion and the formation of a ternary alloy with a modified antiferromagnetic to ferromagnetic transition temperature.

Citation

Physical Review B

Volume

115

Issue

4

Pub Type

Journals

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Keywords

Antiferromagnetic transition, Neutron Reflectivity, Interfacial ferromagnetism, Magnetic thin film, PEEM, FeRh

Citation

Baldasseroni, C. , Palsson, G. , Bordel, C. , Valencia, S. , Unal, A. , Kronast, F. , Nemsak, S. , Fadley, C. , Borchers, J. , Maranville, B. and Hellman, F. (2014), Effect of Capping Material on Interfacial Ferromagnetism in FeRh Thin Films, Physical Review B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914622 (Accessed October 31, 2024)