Ashton, J.
, Lenahan, P.
, Lichtenwalner, D.
, Lelis, A.
and Anders, M.
(2019),
Electrically detected magnetic resonance study of barium and nitric oxide treatments of 4H-SiC metal- oxide-semiconductor field-effect transistors, Journal of Applied Physics, [online], https://doi.org/10.1063/1.5120704, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929100
(Accessed December 26, 2024)
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Electrically detected magnetic resonance study of barium and nitric oxide treatments of 4H-SiC metal- oxide-semiconductor field-effect transistors
Published
Author(s)
James Ashton, Patrick M. Lenahan, D. J. Lichtenwalner, Aivars Lelis,
Citation
Journal of Applied Physics
Volume
126
Issue
14
Pub Type
Journals
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Created October 9, 2019, Updated October 12, 2021