Stahlbush, R.
, Campisi, G.
, McKitterick, J.
, Maszara, W.
, Roitman, P.
and Brown, G.
(1992),
Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides, IEEE Transactions on Nuclear Science
(Accessed July 27, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides
Published
Author(s)
R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, , George A. Brown
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 30, 1992, Updated October 12, 2021