Stromberg, R.
and Passaglia, E.
(1964),
Ellipsometry in the measurement of surfaces and thin films ::symposium proceedings Washington 1963/, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.MP.256
(Accessed March 14, 2025)
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Ellipsometry in the measurement of surfaces and thin films ::symposium proceedings Washington 1963/
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- NBS MP 256
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NBS MP 256
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NIST Pubs
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Created January 1, 1964, Updated May 19, 2023