Chandler-Horowitz, D.
, Marchiando, J.
and Belzer, B.
(1990),
Ellipsometry SRM's for Use in Thin Film Measurements, Proc., Measurement Science Conference, Anaheim, CA, USA
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Ellipsometry SRM's for Use in Thin Film Measurements
Published
Author(s)
, ,
Proceedings Title
Proc., Measurement Science Conference
Conference Dates
February 8-9, 1990
Conference Location
Anaheim, CA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1990, Updated October 12, 2021