Tsai, B.
, Bodycomb, J.
, DeWitt, D.
, Kreider, K.
and Kimes, W.
(2004),
Emissivity Compensated Pyrometry for Specular Silicon Surfaces on the NIST RTP Test Bed, 12th IEEE Int'l Conf Advanced Thermal Processing - RTP 2004
(Accessed January 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Emissivity Compensated Pyrometry for Specular Silicon Surfaces on the NIST RTP Test Bed
Published
Author(s)
, J Bodycomb, , K G. Kreider, W A. Kimes
Citation
12th IEEE Int'l Conf Advanced Thermal Processing - RTP 2004
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2004, Updated February 17, 2017