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Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines

Published

Author(s)

Uwe Arz, Dylan Williams, Hartmut Grabinski

Abstract

We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study illustrates the important role of the return path in determining the electromagnetic coupling between the lines.
Conference Dates
October 23-25, 2001
Conference Location
Boston, MA, USA
Conference Title
2001 Elect. Perform. of Electronic Pkg.

Keywords

asymmetric coupled lines, ground return path, on-wafer measurement

Citation

Arz, U. , Williams, D. and Grabinski, H. (2001), Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines, 2001 Elect. Perform. of Electronic Pkg., Boston, MA, USA (Accessed October 31, 2024)

Issues

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Created October 1, 2001, Updated October 12, 2021