Carasso, A.
and Vladar, A.
(2010),
Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7727
(Accessed November 8, 2024)
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Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery:
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NIST IR 7727
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Created January 1, 2010, Updated May 20, 2023