Stan, G.
and Solares, S.
(2014),
Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies, Beilstein Journal of Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914965
(Accessed January 29, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies
Published
Author(s)
,
Abstract
We analysed the resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, differing in the method used to excite the system (cantilever base vs. sample excitation). We discussed similarities and differences in the observables, as well as the different effect of the tip-sample contact properties on those observables in each configuration. Finally, we explored the expected accuracy of CR-AFM using phase-locked loops, providing a quantification of the typical errors incurred during measurement.Citation
Beilstein Journal of Nanotechnology
Pub Type
Journals
Download Paper
Keywords
dynamic AFM, contact-resonance AFM, viscoelasticity, phase-locked loop, frequency modulation
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 12, 2014, Updated February 19, 2017