Witczak, S.
, Schrimpf, R.
, Fleetwood, D.
, Galloway, K.
, Lacoe, R.
, Mayer, D.
, Puhl, J.
, Pease, R.
and Suehle, J.
(1997),
Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures, IEEE Transactions on Nuclear Science
(Accessed January 13, 2025)
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Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures
Published
Author(s)
S C. Witczak, R D. Schrimpf, D M. Fleetwood, K F. Galloway, R C. Lacoe, D C. Mayer, , R L. Pease,
Citation
IEEE Transactions on Nuclear Science
Volume
44
Issue
6
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1996, Updated October 12, 2021