Seiler, D.
, Harman, G.
, Lowney, J.
, Mayo, S.
and Liggett, W.
(1991),
HgCdTe Detector Reliability Study for the GOES Program, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=11016
(Accessed November 8, 2024)
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HgCdTe Detector Reliability Study for the GOES Program
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, , , , W S. Liggett
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NIST Interagency/Internal Report (NISTIR) -
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Created September 29, 1991, Updated October 12, 2021