Seiler, D.
, Harman, G.
, Lowney, J.
, Mayo, S.
and Liggett, W.
(1991),
HgCdTe detector reliability study for the GOES Program:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.4687
(Accessed March 14, 2025)
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HgCdTe detector reliability study for the GOES Program:
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- NIST IR 4687
Report Number
NIST IR 4687
Pub Type
NIST Pubs
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Created January 1, 1991, Updated May 19, 2023