Ratliff, L.
and Roberts, J.
(2001),
Highly Charged Ion Studies at the NIST EBIT, Nova Science Publishers Published as Chapter 9 of: Trapping Highly Charged Ions: Fundamentals and Applications, ed. J.D. Gillaspy, Nova Science Publishers,
(Accessed November 8, 2024)
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Highly Charged Ion Studies at the NIST EBIT
Published
Author(s)
,
Citation
Highly Charged Ion Studies at the NIST EBIT
Publisher Info
Nova Science Publishers Published as Chapter 9 of: Trapping Highly Charged Ions: Fundamentals and Applications, ed. J.D. Gillaspy, Nova Science Publishers,
Pub Type
Books
Keywords
atoms, EBIT, electron beam ion trap, highly charged ions, ions
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2001, Updated February 17, 2017