Jeffery, A.
and Koffman, A.
(2002),
Improved 1 kHz Capacitance Calibration Uncertainty, Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33109
(Accessed November 24, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Improved 1 kHz Capacitance Calibration Uncertainty
Published
Author(s)
,
Abstract
Uncertainties for 1 kHz capacitance calibrations have been decreased at the National Institute of Standards and Technology (NIST). The improvements are based on frequency-dependence characterization from 1592 Hz to 1 kHz. The relevant measurements and the traceability procedures from the calculable capacitor to the customer calibration are described.Conference Dates
May 21-23, 2002
Conference Location
Anchorage, AK, USA
Conference Title
Instrumentation and Measurement Technology Conference
Pub Type
Conferences
Download Paper
Keywords
calibration, capacitance, farad, fused-silica capacitor, impedance, measurement
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 29, 2002, Updated October 12, 2021