Powell, C.
and Tanuma, S.
(2016),
Inelastic Mean Free Paths, Mean Escape Depths, Information Depths, and Effective Attenuation Lengths for Hard X-ray Photoelectron Spectroscopy, Springer-Verlag, Berlin, -1, [online], https://doi.org/10.1007/978-3-319-24043-5_5
(Accessed December 26, 2024)
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Inelastic Mean Free Paths, Mean Escape Depths, Information Depths, and Effective Attenuation Lengths for Hard X-ray Photoelectron Spectroscopy
Published
Author(s)
, Shigeo Tanuma
Abstract
An overview is given of recent work on the determination of inelastic mean free paths, mean escape depths, information depths, and effective attenuation lengths for applications in hard X-ray photoelectron spectroscopy (HAXPES). Sources of data are provided for these parameters and useful predictive equations are given. Information is given on databases available from the National Institute of Standards and Technology (NIST) for HAXPES applications.Citation
Hard X-ray Photoelectron Spectroscopy
Publisher Info
Springer-Verlag, Berlin, -1
Pub Type
Books
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Keywords
effective attenuation length, hard x-ray photoelectron spectroscopy, inelastic mean free path, information depth, mean escape depth
Citation
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Created June 1, 2016, Updated June 2, 2021