Nguyen, N.
, Pellegrino, J.
, Amirtharaj, P.
, Seiler, D.
and Qadri, S.
(1993),
Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry, Journal of Applied Physics
(Accessed July 18, 2024)
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Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published
Author(s)
, Joseph G. Pellegrino, , , S. B. Qadri
Citation
Journal of Applied Physics
Volume
73
Issue
11
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1993, Updated October 12, 2021