U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Interfacial Scattering of Hot Electrons in Ultrathin Au/Co Films

Published

Author(s)

R P. Lu, B A. Morgan, K L. Kavanagh, Cedric J. Powell, P J. Chen, F Serpa, William F. Egelhoff Jr.

Abstract

We have used room temperature, ballistic electron emission microscopy (BEEM) to measure hot-electron transport through ultra-thin Au/Co multilayre structures deposited onto Si. The samples consist of Au/Co/Si or (Au/Co)n/AuSi diodes, sputter deposited at 175K to 300K, where n is the number of repeat layers.
Citation
Journal of Vacuum Science and Technology
Volume
18
Pub Type
Journals

Keywords

ballistic electron emission microscopy (, hot electrons, interfacial scattering

Citation

Lu, R. , Morgan, B. , Kavanagh, K. , Powell, C. , Chen, P. , Serpa, F. and Egelhoff Jr., W. (2000), Interfacial Scattering of Hot Electrons in Ultrathin Au/Co Films, Journal of Vacuum Science and Technology (Accessed December 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1999, Updated October 12, 2021