Intrinsic defects in perpendicularly magnetized multilayer thin films and nanostructures

Published

October 26, 2010

Author(s)

Justin M. Shaw, Miles Olsen, June W. Lau, Michael L. Schneider, Thomas J. Silva, Olav Hellwig, Elizabeth Dobisz, Bruce D. Terris

Abstract

Intrinsic magnetic defects in perpendicularly magnetized nanostructures reduce the predictability of device and developing recording technologies. In addition to a distribution of local anisotropy fields, we show that such defects also exhibit variations in local anisotropy axes. The magnetic defects are identified by the application of in-plane and out-of-plane magnetic fields and magnetic force microscopy imaging. Those defects that control magnetization reversal in arrays of patterned Co/Pd multilayers are highly dependent on applied field orientation. The symmetry of the defects with respect to the applied field direction indicates that the anisotropy consists of a canted axis, deviating from the surface normal. Micromagnetic simulations confirm that variations in anisotropy axis can cause a significant change in reversal field depending on the location and orientation of the defects, consistent with experimental results.

Citation

Physical Review B

Volume

82

Pub Type

Journals

Keywords

Nanomagnetics, magnetic nanostructures, magnetic defects, multilayers, thin films

Citation

Shaw, J. , Olsen, M. , Lau, J. , Schneider, M. , Silva, T. , Hellwig, O. , Dobisz, E. and Terris, B. (2010), Intrinsic defects in perpendicularly magnetized multilayer thin films and nanostructures, Physical Review B (Accessed November 22, 2024)