Chu, W.
, Fu, J.
, Dixson, R.
and Vorburger, T.
(2007),
Linewidth Measurement Based on Automatically Matched and Stitched Images, Proceedings of the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics: 2007, Harbin, 1, CH
(Accessed January 15, 2025)