Koffman, A.
and Chang, Y.
(2000),
Low-Frequency Impedance Calibrations at NIST, Proc. 2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Toronto, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=21381
(Accessed January 13, 2025)
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Low-Frequency Impedance Calibrations at NIST
Published
Author(s)
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Abstract
This paper presents an overview of the low-frequency impedance measurement services offered through the Impedance Calibration Laboratory (ICL) at the National Institute of Standards and Technology (NIST). Emphasis will be given to recent improvements as well as plans for future improvements in the dissemination of the farad and the henry.Proceedings Title
Proc. 2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 16-20, 2000
Conference Location
Toronto, 1, CA
Pub Type
Conferences
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Keywords
calibration, capacitance, farad, henry, low-frequency impedance, inductance, measurement service, special test
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 30, 2000, Updated October 12, 2021