Silva, T.
(2001),
Measurement of Dynamic Properties in Thin-Films, Springer Verlag,
(Accessed March 14, 2025)
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Measurement of Dynamic Properties in Thin-Films
Published
Author(s)
Abstract
I present a summary of the various techniques available for the determination of response times in magnetic recording head materials. In addition, I derive useful equations for the interpretation of data in the context of the Landau-Lifshitz-Gilbert formalism. Techniques that are covered include inductive, optical, and magnetoresistive methods. Strengths and weaknesses of each technique are discussed.Citation
Physics of Ultrahigh Density Magnetic Recording
Publisher Info
Springer Verlag,
Pub Type
Books
Citation
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Created December 1, 2001, Updated June 2, 2021