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Data & informatics

News and Updates

Blog Posts

From Trash to Cash: How AI and Machine Learning Can Help Make Recycling Less Expensive for Local Governments

Listening to the Data: How a NIST Tool Helps Labs Worldwide Harmonize Measurements

Seek and You Will (Probably) Find: Helping Mine COVID-19 Research Data

Events

Projects and Programs

METIS

Ongoing
A Metrology Exchange to Innovate in Semiconductors

Publications

Detection limits of AI-based SEM dimensional metrology

Author(s)
Peter Bajcsy, Brycie Wiseman, Michael Paul Majurski, Andras Vladar
The speed of in-line scanning electron microscope (SEM) measurements of linewidth, contact hole, and overlay is critically important for identifying the

IEEE 1451.0-based Web of Thing (WoT) Ontology

Author(s)
Eugene Song, Helbert da Rocha, Antonio Espirito-Santo, Riccardo Brama
Internet of Things (IoT) ecosystems are highly heterogeneous in terms of smart sensors/devices, connectivity, communication protocols, data formats, and

NIST conference papers fiscal year 2024

Author(s)
Kathryn Miller, Myriam Dilawari, Julie Jew
This Special Publication represents the work of researchers at professional conferences, as reported by NIST employees in Fiscal Year 2024 (October 1, 2023

Software

The NIST Data Alignment Tool

The Data Alignment Tool (DAT) was built to assist with the analysis of data used in testing fault detection and diagnostics (FDD) tools and building

RECIPE

RECIPE is a FORTRAN program for determining one-sided tolerance limits (in particular, A- and B-basis material property values) for regression models in the

Tools and Instruments

Awards