Thurber, W.
, Lowney, J.
and Phillips, W.
(1984),
Measurement techniques for high-power semiconductor materials and devices ::annual report, January 1, 1982 to March 31, 1983, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.84-2838
(Accessed July 27, 2024)
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Measurement techniques for high-power semiconductor materials and devices ::annual report, January 1, 1982 to March 31, 1983
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- NBS IR 84-2838
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NBS IR 84-2838
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NIST Pubs
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Created January 1, 1984, Updated May 19, 2023