Oettinger, F.
(1979),
Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1977 to September 30, 1978, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.79-1756
(Accessed November 8, 2024)
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Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1977 to September 30, 1978
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- NBS IR 79-1756
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NBS IR 79-1756
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NIST Pubs
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Created January 1, 1979, Updated May 19, 2023