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PUBLICATIONS

A Method to Compare Vector Nonlinear Network Analyzers

Published

Author(s)

Kate Remley, Donald C. DeGroot, Jeffrey Jargon, Kuldip Gupta

Abstract

We address the difficult problem of determining measurement consistency between two vector nonlinear network analyzers, a new class of stimulus-response instruments that acquire multiharmonic waveform data instead of normalized network parameters. We develop a set of nonlinear verification devices and a method to compare the systems, and then demonstrate that measurements from three different nonlinear network analyzers are consistent to within 1.3% of the amplitude of the applied stimulus signal.
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume
3
Conference Dates
May 20-25, 2001
Conference Location
Phoenix, AZ, USA
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/MWSYM.2001.967225
Local Download

Keywords

assurance, diode circuits, measurement, measurement consistency, measurement intercomparison, nonlinear measurements, nonlinear vector network analyzer, nonlinear verification
Electromagnetics

Citation

Remley, K. , DeGroot, D. , Jargon, J. and Gupta, K. (2001), A Method to Compare Vector Nonlinear Network Analyzers, Tech. Dig., IEEE MTT-S International Microwave Symposium, Phoenix, AZ, USA, [online], https://doi.org/10.1109/MWSYM.2001.967225, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=14478 (Accessed December 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 30, 2001, Updated October 12, 2021