Scholtz, J.
(2004),
Metric mapping concepts for TIA:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7061
(Accessed November 8, 2024)
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Metric mapping concepts for TIA:
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- NIST IR 7061
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NIST IR 7061
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NIST Pubs
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Created January 1, 2004, Updated May 20, 2023