Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Microscale Mapping of Structure and Stress in Barium Titanate

Published

Author(s)

Jane A. Howell, Mark D. Vaudin, Lawrence Henry Friedman, Robert F. Cook

Abstract

Cross-correlation of electron backscatter diffraction (EBSD) patterns was used to generate rotation, strain, and stress maps of single-crystal tetragonal barium titanate (BaTiO3) containing isolated, small, sub-micrometer a domains separated from a c- domain matrix by 90° domain boundaries. Spatial resolution of about 30 nm was demonstrated over 5 μm maps, with rotation and strain resolutions of approximately 10−4. The magnitudes of surface strains and, especially, rotations peaked within and adjacent to isolated domains at values of approximately 10−2, i.e., the tetragonal distortion of BaTiO3. The conjugate stresses between a domains peaked at about 1 GPa, and principal stress analysis suggested that stable microcrack formation in the c domain was possible. The results clearly demonstrate the applicability of EBSD to advanced multilayer ceramic capacitor reliability and strongly support the coupling between the electrical performance and underlying mechanical state of BaTiO3-containing devices.
Citation
Journal of Research (NIST JRES) -
Volume
125

Keywords

barium titanate (BaTiO3), domain, electron backscatter diffraction, microdomain, single crystal, strain, stress

Citation

Howell, J. , Vaudin, M. , Friedman, L. and Cook, R. (2020), Microscale Mapping of Structure and Stress in Barium Titanate, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/jres.125.013 (Accessed November 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 18, 2020, Updated October 12, 2021