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PUBLICATIONS

Microscopy and Microanalysis of Individual Collected Particles- Chapter 10

Published

Author(s)

Robert A. Fletcher, Nicholas W. Ritchie, Ian M. Anderson, John A. Small

Abstract

This chapter describes microscopy and microanalysis techniques used for the characterization of collected, individual particles in a variety of instruments. The instruments discussed are the light microscope, electron microscopes (both scanning and transmission), electron microprobes, laser, optical, scanning probe and ion microprobes. The principles of operation and the instrumental capabilities are presented. The chapter also contains some basic information about sample preparation, useful for the aerosol scientist.
Citation
Aerosol Measurement
Publisher Info
John Wiley & Sons, Inc., Hoboken, NJ
Pub Type
Book Chapters

Keywords

individual particle analysis, Microanalysis, microprobes, single particle, collected aerosol

Citation

Fletcher, R. , Ritchie, N. , Anderson, I. and Small, J. (2011), Microscopy and Microanalysis of Individual Collected Particles- Chapter 10, Aerosol Measurement, John Wiley & Sons, Inc., Hoboken, NJ (Accessed December 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 5, 2011, Updated February 19, 2017