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PUBLICATIONS

Modeling Microstructures with OOF2

Published

Author(s)

Andrew C. Reid, Rhonald Lua, R E. Garcia, Valerie R. Coffman, Stephen A. Langer

Abstract

OOF2 is a program for computing the properties and behavior of material microstructures, beginning with an image of the microstructural geometry. OOF2 uses finite elements, but is designed to be used by materials scientists with little or no finite element experience. It can solve a wide range of physical phenomena and can be (and is being) extended to solve even more. This paper is an introduction to some of the features of OOF2.
Citation
International Journal of Materials and Product Technology
Volume
35
Pub Type
Journals

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Keywords

finite element, microstructure
Mathematics and statistics and Numerical methods and software

Citation

Reid, A. , Lua, R. , Garcia, R. , Coffman, V. and Langer, S. (2009), Modeling Microstructures with OOF2, International Journal of Materials and Product Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=51176 (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 1, 2009, Updated January 27, 2020