Wilson, C.
and Blue, J.
(1985),
MOS1 a program for two-dimensional analysis of Si MOSFETs:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-77
(Accessed November 9, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
MOS1 a program for two-dimensional analysis of Si MOSFETs:
Published
Author(s)
,
Citation
- NBS SP 400-77
Report Number
NBS SP 400-77
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1985, Updated May 19, 2023