Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

Published

October 25, 2016

Author(s)

Thomas Germer, Martin Foldyna, Zuzana Mrazkova

Abstract

Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.

Proceedings Title

Reflection, Scattering, and Diffraction from Surfaces V

Volume

9961

Conference Dates

August 28-29, 2016

Conference Location

San Diego, CA, US

Conference Title

SPIE Optics and Photonics

Pub Type

Conferences

Download Paper

https://doi.org/10.1117/12.2236976

Local Download

Keywords

BRDF, Mueller matrix, photovoltaics, pyramids, scattering, surface texture

Citation

Germer, T. , Foldyna, M. and Mrazkova, Z. (2016), Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces, Reflection, Scattering, and Diffraction from Surfaces V, San Diego, CA, US, [online], https://doi.org/10.1117/12.2236976, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921524 (Accessed January 2, 2025)