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Nanoindentation of Polymers: An Overview

Published

Author(s)

Mark R. VanLandingham, John S. Villarrubia, William F. Guthrie, G F. Meyers

Abstract

Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing indentation rely on indentation results from a reference material, and the reproducibility of these methods has been poor in a recent interlaboratory comparison. In this paper, a technique referred to as blind reconstruction is used as a material-independent method for characterizing the tip shapes of probes used with the AFM to indent polymeric materials. Results using this method are compared to results of a material-dependent tip shape analysis, particularly with regard to experimental uncertainties.
Citation
Macromolecular Symposia
Volume
167

Keywords

atomic force microscope, blind reconstruction, mechanical properties, nanoindentation, polymers, tip shape calibration

Citation

VanLandingham, M. , Villarrubia, J. , Guthrie, W. and Meyers, G. (2001), Nanoindentation of Polymers: An Overview, Macromolecular Symposia (Accessed October 31, 2024)

Issues

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Created February 28, 2001, Updated October 12, 2021