Fiumara, G.
, Flanagan, P.
, Grantham, J.
, Ko, K.
, Marshall, K.
, Schwarz, M.
, Tabassi, E.
, Woodgate, B.
and Boehnen, C.
(2019),
NIST Special Database 302: Nail to Nail Fingerprint Challenge, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2007
(Accessed November 21, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
NIST Special Database 302: Nail to Nail Fingerprint Challenge
Published
Author(s)
, , John D. Grantham, , , Matthew Schwarz, , , Christopher Boehnen
Abstract
In September 2017, the Intelligence Advanced Research Projects Activity (IARPA) held a data collection as part of its Nail to Nail (N2N) Fingerprint Challenge. Participating Challengers deployed devices designed to collect an image of the full nail to nail surface area of a fingerprint–equivalent to a rolled fingerprint–from an unacclimated user, without assistance from a trained operator. Traditional operator-assisted live-scan rolled fingerprints were also captured, along with assorted other friction ridge live-scan and latent captures. The collection of images collected during the N2N Fingerprint Challenge, entitled Special Database 302 (SD 302), can be freely downloaded from the National Institute of Standards and Technology (NIST) website.Citation
Technical Note (NIST TN) - 2007
Report Number
2007
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
biometrics, data, devices, fingerprints, images, latent
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 11, 2019