Stone, P.
and , Y.
(2005),
An Overview of the BEB Method for Electron-Impact Ionization of Atoms and Molecules, Surface and Interface Analysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=840766
(Accessed July 17, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
An Overview of the BEB Method for Electron-Impact Ionization of Atoms and Molecules
Published
Author(s)
,
Abstract
An accurate and simple method for the calculation of electron impact ionization cross sections of atoms and molecules was developed by Kim and Rudd in 1994. Since then many articles by Kim and coworkers have demonstrated the validity of the technique and have applied it to various atomic and molecular systems. The method is particularly useful for modeling programs where numerous cross sections are needed. This paper presents the basic formulas and method of calculation, shows applications to some neutral atoms, and describes the NIST website where results of recent calculations are available. The limitations of the method as well as the advantages are outlined.Citation
Surface and Interface Analysis
Volume
37
Pub Type
Journals
Download Paper
Keywords
atoms, BEB, cross section, electron impact, ionization, molecules
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 25, 2005, Updated February 17, 2017