Jarrett, D.
(2006),
An Overview of Key and Supplementary Comparisons of DC Resistance Involving NIST, Conference Proceedings of NCSL International Workshop and Symposium, Nashville, TN, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32282
(Accessed June 30, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
An Overview of Key and Supplementary Comparisons of DC Resistance Involving NIST
Published
Author(s)
Abstract
Key and supplementary comparisons are of interest to the metrology community because they provide the means of demonstrating the degree of equivalence between the measurement capabilities of national metrology institutes. In recent years, NIST has been involved in both key and supplemental comparisons for DC resistance in the range 1 ?? to 1 G??. While participating in and piloting several of these comparisons, much has been learned, and as a result, both the comparison process and our view of this process has evolved. Topics that will be addressed here include development of protocols, characterization of standards, statistical analysis approaches, and the present status of several comparisons in the area of DC resistance.Proceedings Title
Conference Proceedings of NCSL International Workshop and Symposium
Conference Dates
August 6-10, 2006
Conference Location
Nashville, TN
Conference Title
National Conference of Standards Laboratories (NCSL)
Pub Type
Conferences
Download Paper
Keywords
key comparison, protocol, resistance, standards, statistical
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 1, 2006, Updated January 27, 2020