Powell, C.
(1978),
Quantitative Surface Analysis by Electron Spectroscopy, American Laboratory
(Accessed December 22, 2024)
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Quantitative Surface Analysis by Electron Spectroscopy
Published
Author(s)
Abstract
An overview is given of a new cooperative project under the Implementing Agreement between the Technology Administration, U.S. Department of Commerce, and the Agency of Industrial Science and Technology, Japanese Ministry of International Trade and Industry on Cooperation in Research and Development in Civil Industrial Technology. This new project aims to provide more accurate measurement of a key parameter, the inelastic mean free path, that is needed for quantitative surface analysis of advanced materials, in general, and of catalysts in particular. Initial plans for the project are described.Citation
American Laboratory
Volume
10
Issue
4
Pub Type
Journals
Keywords
catalysis, electron inelastic mean free path, surface analysis, x-ray photoelectron spectroscopy
Citation
Issues
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Created April 1, 1978, Updated February 19, 2017