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PUBLICATIONS

Recent Developments in BIPM Voltage Standard Comparisons

Published

Author(s)

D. Reymann, Thomas J. Witt, P. Vrabcek, Yi-hua D. Tang, Clark A. Hamilton, A. S. Katkov, Blaise Jeanneret, O. Power

Abstract

The BIPM carries out a number of comparisons of DC voltage standards with National Metrology Institutes. These take the form of on-site comparisons of Josephson standards or bilateral comparisons using traveling standards based on Zener diodes. This paper describes some of the new procedures used in both types of comparisons and presents some results of five recent BIPM key comparisons.
Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
May 14-19, 2000
Conference Location
Sydney, 1, AS
Pub Type
Conferences

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Keywords

voltage standards, international key comparisons
Metrology

Citation

Reymann, D. , Witt, T. , Vrabcek, P. , Tang, Y. , Hamilton, C. , Katkov, A. , Jeanneret, B. and Power, O. (2000), Recent Developments in BIPM Voltage Standard Comparisons, Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12898 (Accessed November 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 30, 2000, Updated October 12, 2021