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Search Publications

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Displaying 1 - 25 of 2317

System Vicarious Calibration requirements for satellite ocean colour missions targeting climate and global long-term operational applications

June 24, 2024
Author(s)
B. Carol Johnson, Giuseppe Zibordi, Ewa Kwiatkowska, Kenneth Voss, Frederic Melin, David Antoine, Menghua Wang, Shuguo Chen, Constant Mazeran, Brian Barnes, Jee-Eun Min
System Vicarious Calibration (SVC) is the technique that maximizes the accuracy of satellite ocean colour data products by minimizing the impact of inaccuracies affecting the absolute radiometric calibration of the space sensor and the atmospheric

Quantum metrology algorithms for dark matter searches with clocks

June 7, 2024
Author(s)
Muhammad Zaheer, Naleli Matjelo, David Hume, Marianna Safronova, David Leibrandt
Quantum metrology involves improving the sensitivity of a quantum sensor to a signal while circumventing sensitivity to noise using algorithms from quantum information science. Atomic clocks are among the most sensitive quantum sensors, with recent

Quantum state tracking and control of a single molecular ion in a thermal environment

June 7, 2024
Author(s)
Yu Liu, Julian Schmidt, Zhimin Liu, David Leibrandt, Dietrich Leibfried, Chin-wen Chou
The evolution of molecular quantum states is central to many research areas, including chemical reaction dynamics, precision measurement, and molecule-based quantum technology. Details of the evolution is often obscured, however, when measurements are

Dual-comb correlation spectroscopy of thermal light

May 23, 2024
Author(s)
Eugene Tsao, Alexander Lind, Connor Fredrick, Ryan Cole, Peter Chang, Kristina Chang, Dahyeon Lee, Matthew Heyrich, Nazanin Hoghooghi, Franklyn Quinlan, Scott Diddams
The detection of light of thermal origin is the principal means by which humanity has learned about our world and the cosmos. In optical astronomy, in particular, direct detection of thermal photons and the resolution of their spectra have enabled

An atomic boson sampler

May 8, 2024
Author(s)
Aaron Young, Shawn Geller, William Eckner, Nathan Schine, Scott Glancy, Emanuel Knill, Adam Kaufman

Robustness of the projected squeezed state protocol

May 8, 2024
Author(s)
Byron Alexander, John J. Bollinger, Mark Tame
Projected squeezed (PS) states are multipartite entangled states generated by unitary spin squeezing, followed by a quantum measurement and post-selection. They lead to an appreciable decrease in the state preparation time of the maximally entangled N

Rydberg states of alkali atoms in atomic vapor as SI-traceable field probes and communications receivers

May 8, 2024
Author(s)
Noah Schlossberger, Nik Prajapati, Samuel Berweger, Andrew Rotunno, Aly Artusio-Glimpse, Abrar Sheikh, Eric Norrgard, Christopher L. Holloway, Stephen Eckel
Rydberg states of alkali atoms are highly sensitive to electric fields because their electron wavefunction has a large spatial extent, leading to large polarizabilities for static fields and large transition dipole moments for time-varying fields

Rydberg states of alkali atoms in atomic vapor as SI-traceable field probes and communications receivers

May 8, 2024
Author(s)
Noah Schlossberger, Nik Prajapati, Samuel Berweger, Aly Artusio-Glimpse, Matt Simons, Abrar Sheikh, Andrew Rotunno, Eric Norrgard, Stephen Eckel, Christopher L. Holloway
Rydberg states of alkali atoms are highly sensitive to electric fields because their electron wavefunction has a large spatial extent, leading to large polarizabilities for static fields and large transition dipole moments for time-varying fields

Single-electron states of phosphorus-atom arrays in silicon

May 8, 2024
Author(s)
Maicol Ochoa, Keyi Liu, Michal Zielinski, Garnett W. Bryant
We characterize the single-electron energies and the wavefunction structure of arrays with two, three, and four phosphorus atoms in silicon by implementing atomistic tight-binding calculations and analyzing wavefunction overlaps to identify the single

JARVIS-Leaderboard: A Large Scale Benchmark of Materials Design Methods

May 7, 2024
Author(s)
Kamal Choudhary, Daniel Wines, Kevin Garrity, aldo romero, Jaron Krogel, Kayahan Saritas, Panchapakesan Ganesh, Paul Kent, Pascal Friederich, Vishu Gupta, Ankit Agrawal, Pratyush Tiwary, ichiro takeuchi, Robert Wexler, Arun Kumar Mannodi-Kanakkithodi, Avanish Mishra, Kangming Li, Adam Biacchi, Francesca Tavazza, Ben Blaiszik, Jason Hattrick-Simpers, Maureen E. Williams
Reproducibility and validation are major hurdles for scientific development across many fields. Materials science in particular encompasses a variety of experimental and theoretical approaches that require careful benchmarking. Leaderboard efforts have

Indium Bump Bonding: Advanced Integration Techniques for Low-Temperature Detectors and Readout

April 20, 2024
Author(s)
Tammy Lucas, John Biesecker, W.Bertrand (Randy) Doriese, Shannon Duff, Malcolm Durkin, Richard Lew, Joel Ullom, Michael Vissers, Dan Schmidt
We have examined the influence of bump shape and bonding pressure on low temperature electrical properties of indium bump connections including transition temperature, normal resistance, and superconducting critical current. We describe our test structures

Experimental speedup of quantum dynamics through squeezing

April 17, 2024
Author(s)
Shaun Burd, Hannah Knaack, Raghavendra Srinivas, Christian Arenz, Alejandra Collopy, Laurent Stephenson, Andrew C. Wilson, David Wineland, Dietrich Leibfried, John J. Bollinger, David Allcock, Daniel Slichter
We show experimentally that a broad class of interactions involving quantum harmonic oscillators can be made stronger (amplified) using a unitary squeezing protocol. While our demonstration uses the motional and spin states of a single trapped $^25}$Mg$^+}

Tunable zero-field magnetoresistance responses in Si transistors: Origins and applications

April 16, 2024
Author(s)
Stephen Moxim, Nicholas Harmon, Kenneth Myers, James P Ashton, Elias Frantz, Michael Flatte, Patrick Lenahan, Jason Ryan
The near-zero-field magnetoresistance (NZFMR) response has proven to be a useful tool for studying atomic-scale, paramagnetic defects that are relevant to the reliability of semiconductor devices. The measurement is simple to make and, in some cases
Displaying 1 - 25 of 2317