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Displaying 30826 - 30850 of 73812

Multisine Signals for Wireless System Test and Design

June 13, 2008
Author(s)
Catherine A. Remley, Nuno Carvalho, Dominique Schreurs, Kevin Gard
We discuss the use of multisine test signals for system verification and model development in the laboratory. We highlight the utility of multisine excitation for test and verification of telecommunication systems, where nonlinear elements such as power

Thermal Network Component Models for 10 kV SiC Power Module Packages

June 13, 2008
Author(s)
Jose M. Ortiz, Madelaine H. Hernandez, Tam H. Duong, Scott G. Leslie, Allen R. Hefner Jr.
The DARPA WBGS-HPE program is developing 100 A, 10 kV SiC power modules to demonstrate the viability of a 2.75 MVA Solid State Power Substation that uses 10 kV, 20 kHz switching-capable devices. Thermal network component models for these modules are

Proceedings of the Static Analysis Workshop (SAW 2008)

June 12, 2008
Author(s)
Paul E. Black, Elizabeth N. Fong
Static Analysis Workshop (SAW 2008) was held on June 12, 2008 in Tucson, Arizona and was co-located with ACM SIGPLAN 2008 Conference on Programming Language Design and Implementation (PLDI 2008). This workshop followed Static Analysis Summit, held in 2006

Modeling and Simulation for Sustainable Manufacturing

June 11, 2008
Author(s)
Deogratias Kibira, Charles R. McLean
With increasing frequency the news media reports that the planet is warming, pollutants are contaminating the environment, energy costs are rising, and precious natural resources are dwindling. These reports are sounding an alarm that we need to change the

Usability and Biometrics: Ensuring Successful Biometric Systems

June 11, 2008
Author(s)
Mary F. Theofanos, Brian C. Stanton, Cari Wolfson
The National Institute of Standards and Technology (NIST)Visualization and Usability Gropu initiated a Usability and Biometrics effort to focus on the users and human factors of biometric systems. The goal of this effort has been to conduct research to

Nanoimprint Lithography and the Role of Viscoelasticity in the Generation of Residual Stress in Model Polystyrene Patterns

June 10, 2008
Author(s)
Yifu Ding, Hyun Wook Ro, Jing N. Zhou, Brian C. Okerberg, Jack F. Douglas, Alamgir Karim, Christopher L. Soles
Understanding polymer deformation during the nanoimprinting process is key to achieve robust polymer nanostructures. Information regarding the process can be extracted from monitoring the decay of the imprinted polymer patterns during thermal annealing. In

Scanning Probe Microscopy for Dielectric and Metal Characterization

June 10, 2008
Author(s)
Joseph J. Kopanski, Thomas R. Walker
The properties of both insulators and metals can be characterized capacitively with scanning probe microscopy, though the techniques employed are different. Intermittent contact scanning capacitance microscopy (IC-SCM) is a useful technique for

Subspace Linear Discriminant Analysis for Face Recognition

June 10, 2008
Author(s)
W Zhao, R Chellappa, P. Jonathon Phillips
In this correspondence, we describe a holistic face recognition method based on subspace Linear Discriminant Analysis (LDA). Like existing methods, this method consists of two steps: first, the face image is projected into a face subspace via Principal

Understanding EuP and REACH

June 10, 2008
Author(s)
John V. Messina, Eric D. Simmon
There has been a world-wide trend towards legislation meant to encourage sustainable manufacturing and minimize the environmental impact of product manufacturing. In the global economy, with its distributed supply chain, local environmental laws may affect

Violation of Cauchy-Schwarz Inequality in the Macroscopic Regime

June 10, 2008
Author(s)
Alberto M. Marino, V Boyer, Paul D. Lett
We have observed a violation of the Cauchy-Schwarz inequality in the macroscopic regime by more than 8 standard deviations. The violation has been obtained while filtering out only the low frequency noise of the quantum-correlated beams that results from

Calculated Performance of Low-Porosity Regenerators at 4 K with He-4 and He-3

June 9, 2008
Author(s)
Ray Radebaugh, Yonghua Huang, Agnes A. O'Gallagher, John M. Gary
Previously we have shown that the lower volumetric heat capacity and more ideal behavior of helium-3 compared with helium-4 at 4 K results in an improved performance for packed sphere regenerators operating with helium-3 between 4 K and about 20 K. In this

Extraction of trench geometry and linewidth of nanoscale grating targets in (110)-oriented silicon using angle-resolved scatterometry

June 9, 2008
Author(s)
Heather J. Patrick, Thomas A. Germer, Michael W. Cresswell, Bin Li, Huai Huang, Paul S. Ho
The extraction of nanoscale dimensions and feature geometry of grating targets using signature-based optical techniques is an area of continued interest in semiconductor manufacturing. In the current work, we have performed angle-resolved scatterometry

Improvements in the NIST Johnson Noise Thermometry System

June 9, 2008
Author(s)
Samuel Benz, Horst Rogalla, Rod White, Jifeng Qu, Paul Dresselhaus, Wes L. Tew, Sae Woo Nam
We have developed a Johnson noise thermometry system that is calibrated by precision waveforms synthesized with a quantum-accurate voltage noise source (QVNS). Significant improvements to the QVNS and the cross-correlation measurement electronics have

Precision Differential Sampling Measurements of Low-Frequency Voltages Synthesized with an AC Programmable Josephson Voltage Standard

June 9, 2008
Author(s)
Alain Rufenacht, Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson
Sampling is a promising technique to compare the stepwise-approximated sine waves synthesized by an AC Programmable Josephson Voltage Standard to the sinusoidal voltages of a secondary source at low frequencies (a few hundred Hz or less). This paper

Progress toward a 1V Pulse-Driven AC Josephson Voltage Standard

June 9, 2008
Author(s)
Samuel Benz, Paul Dresselhaus, Norman F. Bergren, Regis Landim
We present a new record output voltage of 275 mVrms, which is a 25% improvement over the maximum achieved with previous ac Josephson voltage standard circuits. We demonstrate operating margins for these circuits and use them to measure the harmonic

Pulse Tube Cryocooler for Rapid Cooldown of A Superconducting Magnet

June 9, 2008
Author(s)
Michael A. Lewis, Ryan P. Taylor, Peter E. Bradley, Isaac Garaway, Ray Radebaugh
A single-stage pulse tube cryocooler was designed to provide rapid cooldown of a high temperature superconducting (HTS) magnet that is part of a gyrotron required for the generation of a high-power mm-wave (95 GHz) beams. These beams are used in the

Towards a Low-Jitter 10 GHz Pulsed Source with an Optical Frequency Comb Generator

June 9, 2008
Author(s)
Shijun Xiao, Leo W. Hollberg, Nathan R. Newbury, Scott A. Diddams
We demonstrate low residual timing jitter of 10 GHz pulses from a 1.55 m optical frequency comb generator based on a doubly-resonant electro-optic modulator. The comb spectral phase is shown to be linear for each sideband but of different slopes. The

ANTENNA TEST RANGE IMAGING USING SPHERICAL NEAR-FIELD SCANNING

June 8, 2008
Author(s)
Michael H. Francis, Ronald C. Wittmann, Randy Direen
Although the theory is straightforward, practical implementation of spherical near-field scanning for evaluating test chambers presents some significant challenges. Among these are the selection of an appropriate probe and the difficulty in minimizing

Bilateral optical fiber power meter linearity comparison between NMIJ and NIST

June 8, 2008
Author(s)
Seiji Mukai, Kuniaki Amemiya, Michiyuki Endo, Igor Vayshenker, Xiaoyu X. Li, Shao Yang
Optical fiber power meter (OFPM) linearity standards of NMIJ (Japan) and NIST (USA) are compared using a commercial OFPM as a transfer standard at 1310 nm and 1550 nm over a power range [-60 dBm, 0 dBm]. At both wavelengths the comparison indicates an

Calibrated Broadband Electrical Characterization of Nanowires

June 8, 2008
Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos
A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as a direct measurement of the capacitive coupling that is in parallel with the nanowire

Complete waveform characterization at NIST

June 8, 2008
Author(s)
Paul D. Hale, Tracy S. Clement, Darryl A. Keenan, Dylan F. Williams, Arkadiusz C. Lewandowski, C. M. Wang, Andrew Dienstfrey
We present a method for calibrating the voltage a pulse generator delivers to a load at every point in the measured waveform epoch. The calibration includes an equivalent circuit model of the generator so that the user can calculate how the generator will
Displaying 30826 - 30850 of 73812
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