Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 351 - 375 of 2605

Recommended practice for calibrating vacuum gauges of the ionization type

April 27, 2018
Author(s)
James A. Fedchak, Patrick J. Abbott, Jay H. Hendricks, Paul C. Arnold, Neil T. Peacock
This document represents a recommended practice for the calibration of ionization gauges using the comparison method. In this method, ionization gauges are compared to a working standard that has an SI traceable calibration. The ionization gauge is either

How measurement science can improve confidence in research results

April 23, 2018
Author(s)
Anne L. Plant, Chandler A. Becker, Robert J. Hanisch, Ronald F. Boisvert, Antonio M. Possolo, John T. Elliott
The concepts and methods of measurement science can help provide clarity in the definition of reproducibility and its role in the scientific process. The qualities of rigorous research include reproducibility as one component, but there are other important

Virtual Metrology White Paper - INTERNATIONAL ROADMAP FOR DEVICES AND SYSTEMS(IRDS)

April 9, 2018
Author(s)
Ndubuisi G. Orji, Yaw S. Obeng, Carlos Beitia, Supika Mashiro, James Moyne
This white paper provides an overview of virtual metrology (VM) and the benefits it can provide, with cost reduction (both capital expenditure and cycle time) being the primary benefit. The white paper also examines some of the issues preventing wider

Enhancing optical microscopy illumination to enable quantitative imaging

March 18, 2018
Author(s)
Emil Agocs, Ravikiran Attota
There has been an increasing push to derive quantitative measurements using optical microscopes. While several aspects of microscopy have been identified to enhance quantitative imaging, non- uniform angular illumination asymmetry (ANILAS) across the field

Direct DC 10 V comparison between two Programmable Josephson Voltage Standards made of Niobium Nitride (NbN)-based and amorphous niobium silicon (NbxSi1-x)-based Josephson Junctions

March 15, 2018
Author(s)
Alain Rufenacht, Stephane Solve, M Maruyama, Chiharu Urano, Nobu Kaneko
For the first time, the BIPM’s new transportable programmable Josephson voltage standard (PJVS) has been used for an on-site comparison at the National Metrology Institute of Japan (NMIJ), the National Institute of Advanced Industrial Science and

Towards Traceable Transient Pressure Metrology

March 13, 2018
Author(s)
Douglas A. Olson, Haijun Liu, Zeeshan Ahmed, Kevin O. Douglass
Here we detail our progress in developing the infrastructure for traceable transient measurements of pressure and temperature. Towards that end, we have built and characterized a dual diaphragm shock tube that allows us to achieve shock amplitude

NIST Standards for Measurement, Instrument Calibration, and Quantification of Gaseous Atmospheric Species

March 2, 2018
Author(s)
George C. Rhoderick, Michael E. Kelley, Walter R. Miller Jr., James E. Norris, Jennifer Carney, Lyn Gameson, Christina Cecelski, Cassie Goodman, Abneesh Srivastava, Joseph Hodges
There are many gas species present in the atmosphere that are associated with the earth’s climate. These compounds absorb and emit radiation, a process which is the fundamental cause of the greenhouse effect. The major greenhouse gases in the earth’s

Optical Fiber Fabry-Perot Micro-Displacement Sensor for MEMS In-plane Motion Stage

February 28, 2018
Author(s)
Yong Sik Kim, Nicholas Dagalakis, Young-Man Choi
Fabry-Perot interferometer sensors have been widely used in Micro-Electro-Mechanical-Systems (MEMS) due to high displacement accuracy and immunity to electromagnetic noises, but they are still limited by micro scale measurement range. In this paper, a

Synchrotron Methods for Flexible Hybrid Electronics Industrial Recommendations on Interagency (DoC-DoD-DoE) Partnerships to Address Measurement Challenges Hindering the Flexible Hybrid Electronics Manufacturing Ecosystem

February 12, 2018
Author(s)
Christopher L. Soles, Richard A. Vaia, Ronald Pindak
The round-table participants concluded that facilities at NSLS-II provide immediate opportunities to address some of the critical processing and measurement challenges that are blocking the path towards a sustainable US-centric Flexible Hybrid Electronic

Weak localization thickness measurements of embedded phosphorus delta layers in silicon produced by PH3 dosing

January 23, 2018
Author(s)
Joseph A. Hagmann, Xiqiao Wang, Pradeep N. Namboodiri, Jonathan E. Wyrick, Roy E. Murray, Michael D. Stewart, Richard M. Silver
The key building blocks for devices based on the deterministic placement of dopants in silicon are the formation of phosphorus dopant monolayers and the overgrowth of high quality crystalline Si. Lithographically defined dopant delta-layers can be formed

Counting Caenorhabditis elegans: Protocol Optimization and Applications for Population Growth and Toxicity Studies in Liquid Medium

January 17, 2018
Author(s)
Steven Lund, Sanem Hosbas Coskun, Monique Johnson, Christopher Sims, Elijah Petersen, John T. Elliott, Bryant C. Nelson, Leona D. Scanlan, Shannon K. Hanna, Karina Brignoni, Patricia Lapasett
The nematode Caenorhabditis elegans is used extensively in molecular, toxicological and genetics research. However, standardized methods for counting nematodes in liquid culture do not exist despite the wide use of nematodes and need for accurate

AC Signal Characterization for Optimization of a CMOS Single Electron Pump

January 8, 2018
Author(s)
Roy E. Murray, Justin K. Perron, Michael D. Stewart, Neil M. Zimmerman
Pumping single electrons at a set rate is being widely pursued as an electrical current standard. Much work has been done on pumping using a single AC signal, but using multiple coordinated AC signals may help lower error rates. Whether pumping with one or

Quantum for Pressure

January 5, 2018
Author(s)
Jay H. Hendricks, Patrick F. Egan, Jacob E. Ricker, Jack A. Stone Jr., Kevin O. Douglass, Gregory F. Strouse
A team of NIST scientists is working to fundamentally change the way that the unit of pressure is realized and disseminated, an effort that will lead to the elimination of mercury barometer pressure standards.

Bad security metrics: the problem and its solution

January 4, 2018
Author(s)
David W. Flater
It is generally acknowledged that few security metrics have the level of predictive validity that their uses require, but neither the nature of the problem nor the steps needed to avoid it have been fully characterized. This article examines both questions

Orientation Uncertainty Characteristics of Some Pose Measuring Systems

December 31, 2017
Author(s)
Marek Franaszek, Geraldine S. Cheok
We investigate the performance of pose measuring systems which determine an object's pose from measurement of a few fiducial markers attached to the object. Such systems use point-based, rigid body registration to get the orientation matrix. Uncertainty in

Contributions of precision engineering to the revision of the SI

November 28, 2017
Author(s)
Stephan Schlamminger, Harald Bosse, Horst Kunzmann, Jon R. Pratt, Ian Robinson, Michael de Podesta, Paul Shore, Paul Morantz
All measurements performed in science and industry are based on the International System of Units, the SI. It has been proposed to revise the SI following an approach which had already been implemented for the redefinition of the unit of length, the metre

Kicking the Tires of the NIST Microwave Uncertainty Framework Part 2*

November 27, 2017
Author(s)
Ronald A. Ginley
Traceability of a measurement requires two parts. An unbroken chain of measurements and uncertainties for each link of the chain. The NIST Microwave Uncertainty Framework (MUF) can provide both the required parts for a single link in the chain or for
Displaying 351 - 375 of 2605