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Search Publications

NIST Authors in Bold

Displaying 376 - 400 of 74893

Operando XPS for Plasma Process Monitoring: A Case Study on the Hydrogenation of Copper Oxide Confined under h-BN

April 29, 2024
Author(s)
Trey Diulus, Andrew Naclerio, J. Anibal Boscoboinik, Ashley Head, Evgheni Strelcov, Piran Kidambi, Andrei Kolmakov
We demonstrate that ambient pressure x-ray photoelectron spectroscopy (APXPS) can be used for in situ studies of dynamic changes in surface chemistry in a plasma environment. Hexagonal boron nitride (h-BN) was used in this study as a model system since it

Shifts in belowground processes along a temperate forest edge

April 29, 2024
Author(s)
Rose Abramoff, Jeffrey Warren, Jessica Harris, Sarah Ottinger, Sarah Garvey, Joy Winbourne, Andrew Reinmann, David W. Allen, Lucy Hutyra, Margaret Torn, Melanie Mayes
Forests are increasingly fragmented and as a result most forests in the United States are within 1 km of an edge. Edges change environmental conditions of the forest - especially radiation, roughness, and temperature - that can have consequences for plant

Towards a resolution of the spin alignment problem

April 29, 2024
Author(s)
Mohammad Alhejji, Emanuel Knill
Consider the problem of minimizing the entropy of a mixture of states by choosing each state subject to constraints. If the spectrum of each state is fixed, we expect that in order to reduce the entropy of the mixture, we should make the states less

Practical Attack on All Parameters of the DME Signature Scheme

April 28, 2024
Author(s)
Pierre Briaud, Maxime Bros, Ray Perlner, Daniel Smith-Tone
DME is a multivariate scheme submitted to the call for additional signatures recently launched by NIST. Its performance is one of the best among all the candidates. The public key is constructed from the alternation of very structured linear and non-linear

Spatial and Temporal Data Alignment from Disparate Sources for Feature Association

April 25, 2024
Author(s)
Benjamin Standfield, Eric Holterfield, Russell Waddell
Among the chief topic areas of Industry 4.0, digital thread technology offers the opportunity for increased productivity, efficiency, and traceability throughout a product's lifecycle. While the basic concept of digital thread is easy to realize by

Dynamic acoustic optimization of pulse tube refrigerators for rapid cooldown

April 23, 2024
Author(s)
Ryan Snodgrass, Vincent Kotsubo, Scott Backhaus, Joel Ullom
Pulse tube refrigerators are a critical enabling technology for many disciplines that require low temperatures. These refrigerators dominate the total power consumption of most modern cryostats, including those that reach millikelvin temperatures using

Dynamic Calibration of Instrumented Charpy Strikers

April 22, 2024
Author(s)
Akobuije Chijioke, Nicholas Vlajic, Enrico Lucon
Charpy V-notch testing of metallic materials involves application of kilonewton-range force pulses on millisecond time scales, generated by impacting the notched test specimen with a striker mounted to a swinging pendulum. In the instrumented version of

Incorporating Syncable Authenticators Into NIST SP 800-63B

April 22, 2024
Author(s)
Ryan Galluzzo, Andrew Regenscheid, David Temoshok, Connie LaSalle
This supplement to NIST Special Publication 800-63B, Authentication and Lifecycle Management, provides agencies with additional guidance on the use of authenticators that may be synced between devices.

Quantum Scattering of Icosahedron Fullerene C_60} with Noble-Gas Atoms

April 22, 2024
Author(s)
Eite Tiesinga, Jacek Klos, Svetlana Kotochigova
There exist multiple ways to cool neutral molecules. A front runner is the technique of buffer gas cooling, where momentum-changing collisions with abundant cold noble-gas atoms cool the molecules. This approach can, in principle, produce the most diverse

Towards the development of standards and performance metrics for 3D imaging systems

April 22, 2024
Author(s)
Prem Rachakonda, Kamel S. Saidi, Marek Franaszek, Helen Qiao, John Sweetser, Armin Khatoonabadi, David Dechow, Wesley Rhodes
NIST is leading and supporting multiple efforts to develop standards for 3D imaging systems for manufacturing automation applications. Many manufacturers specify the performance of their sensors in non-standard ways and offer no method to verify those

Benford's law in atomic spectra and opacity databases

April 21, 2024
Author(s)
Yuri Ralchenko, Jean-Christophe Pain
The intriguing law of anomalous numbers, also named Benford's law, states that the significant digits of data follow a logarithmic distribution favoring the smallest values. In this work, we test the compliance with this law of the atomic databases

Activity standard and calibrations for 227Th with ingrowing progeny

April 20, 2024
Author(s)
Denis E. Bergeron, Jeffrey T. Cessna, Brittany Broder, Leticia Pibida, Ryan P. Fitzgerald, Morgan DiGiorgio, Elisa Napoli, Brian E. Zimmerman
Thorium-227 was separated from its progeny and standardized for activity by the triple-to-double coincidence ratio (TDCR) method of liquid scintillation counting. Confirmatory liquid scintillation-based measurements were made using efficiency tracing with

Indium Bump Bonding: Advanced Integration Techniques for Low-Temperature Detectors and Readout

April 20, 2024
Author(s)
Tammy Lucas, John Biesecker, W.Bertrand (Randy) Doriese, Shannon Duff, Malcolm Durkin, Richard Lew, Joel Ullom, Michael Vissers, Dan Schmidt
We have examined the influence of bump shape and bonding pressure on low temperature electrical properties of indium bump connections including transition temperature, normal resistance, and superconducting critical current. We describe our test structures

Orphan high field superconductivity in non-superconducting uranium ditelluride.

April 20, 2024
Author(s)
Corey Frank, Sylvia Lewin, Gicela Saucedo Salas, Peter Czajka, Ian Hayes, Hyeok Yoon, Tristin Metz, Johnpierre Paglione, John Singleton, Nicholas Butch
Reentrant superconductivity is an uncommon phenomenon in which the destructive effects of magnetic field on superconductivity are mitigated, allowing a zero-resistance state to survive under conditions that would otherwise destroy it. Typically, the

An Introduction to Machine Learning Lifecycle Ontology and its Applications

April 19, 2024
Author(s)
Milos Drobnjakovic, Perawit Charoenwut, Ana Nikolov, Hakju Oh, Boonserm Kulvatunyou
Machine Learning (ML) adoption is on the rapid rise, with a nearly 40% compound annual growth rate over the next decade. In other words, companies will be flooded with ML models developed with different datasets and software. The ability to have
Displaying 376 - 400 of 74893