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Search Publications

NIST Authors in Bold

Displaying 401 - 425 of 73812

Microstructure effects on the fracture surface resistance of base metal in line pipe steels in high pressure H2 gas

April 29, 2025
Author(s)
Andrew LeBoeuf, Santigopal Samanta, Joseph Ronevich, Christopher San Marchi, Zachary Buck, Matthew Connolly, Lawrence Cho, Kip Findley
Cost-effective transportation of gaseous hydrogen requires the use of long-distance low-carbon steel pipeline networks. Employing higher strength (X65-X70) grades can allow for economic viability by enabling operation at higher pressures. While higher

Multistage Networks for Glassy Holographic Photopolymers

April 29, 2025
Author(s)
Alexander Osterbaan, Andrew Sias, Marianela Trujillo-Lemon, Kieran Fung, Jason Killgore, ROBERT MCLEOD, Christopher Bowman
In the writing of holographic photopolymers, the addition of a third stage cure to the typical polyurethane matrix and acrylate writing monomer steps is used here to modify the ultimate thermomechanical properties of the final holographic photopolymer

A Call for Built-In Biosecurity Safeguards for Generative AI Tools

April 28, 2025
Author(s)
Mengdi Wang, Zaixi Zhang, Amrit Singh Bedi, Alvaro Velasquez, Stephanie Guerra, Sheng Lin-Gibson, Le Cong, Megan Blewett, Yuanhao Qu, Jian Ma, Eric Xing, George Church, Souradip Chakraborty
The rapid adoption of generative AI (GenAI) in biotechnology offers immense potential but also raises serious safety concerns. AI models for protein engineering, genome editing, and molecular synthesis can be misused to enhance viral virulence, design

Application of neutron grating interferometry and tomography to study ancient Korean copper-based coins

April 28, 2025
Author(s)
Youngju Kim, Michael Daugherty, Caitlyn Wolf, Daniel Hussey, Jacob LaManna, David Jacobson, Paul A. Kienzle, Daeseung Kim, Seung Wook Lee, Minsoo Han, Hahn Choo, Jongyul Kim, Taejoo Kim
Distinguishing differences between authentic artifacts and replicas is a significant challenge in the field of cultural heritage. In this study, we explore the application of neutron grating interferometry and tomography techniques to identify ancient

Cannabis Laboratory Quality Assurance Program: Exercise 3 Moisture Final Report

April 28, 2025
Author(s)
Andrea Yarberry, Charles Barber, Laura Wood, Walter Wilson
NIST launched a Cannabis Laboratory Quality Assurance Program (CannaQAP) in 2020 to assist laboratories in demonstrating and improving cannabis (hemp and marijuana) measurement comparability and competence. CannaQAP provided tools that allowed analysts and

Fiscal Year 2024 Annual Report for NIST Cybersecurity and Privacy Program

April 28, 2025
Author(s)
Patrick O'Reilly, Kristina Rigopoulos
Throughout Fiscal Year 2024 (FY 2024) — from October 1, 2023, through September 30, 2024 — the NIST Information Technology Laboratory (ITL) Cybersecurity and Privacy Program successfully responded to numerous challenges and opportunities in security and

The NIST Cybersecurity Framework (CSF) 2.0 (Mandarin Chinese translation)

April 28, 2025
Author(s)
Cherilyn Pascoe, Stephen Quinn, Karen Scarfone
The NIST Cybersecurity Framework (CSF) 2.0 provides guidance to industry, government agencies, and other organizations to manage cybersecurity risks. It offers a taxonomy of high-level cybersecurity outcomes that can be used by any organization —

Microstructural Features and Metastable Phase Formation in a High-Strength Aluminum Alloy Fabricated Using Additive Manufacturing

April 25, 2025
Author(s)
Andrew Iams, Jordan Weaver, Brandon Lane, Lucille Giannuzzi, Feng Yi, Darby LaPlant, John Martin, Fan Zhang
Additive manufacturing (AM) has captured recent attention for its potential to fabricate high-strength aluminum alloy components. A detailed understanding of the microstructure under the as-fabricated conditions is required to harness its potential. We

Photolysis of the peptide bond at 193 and 222 nm

April 25, 2025
Author(s)
Nicholas Drachman, Jacob Vietorisz, Andrew Winchester, Rob Vest, Gregory Cooksey, Sujitra Pookpanratana, Derek Stein
Ultraviolet (UV) light is a well-established tool for fragmenting peptides in vacuum. This study investigates the fragmentation of peptides using 193 and 222 nm light in aqueous solution. Changes in the absorption spectra of solutions of the model

Robust Nodal Behavior in the Thermal Conductivity of Superconducting UTe2

April 25, 2025
Author(s)
Ian Hayes, Tristin E. Metz, Corey Frank, Shanta R. Saha, Nicholas Butch, Vivek Mishra, P. Hirschfeld, Johnpierre Paglione
The superconducting state of the heavy-fermion metal UTe2 has attracted considerable interest because of evidence of spin-triplet Cooper pairing and nontrivial topology. Progress on these questions requires identifying the presence or absence of nodes in

C-V2X Interoperability Analyzer Software Tool: Description and Use

April 24, 2025
Author(s)
Yuyin Song, Davide Pesavento, Thomas Roth, Tyler Wong
Autonomous vehicles (AVs) can perform driving tasks without any human intervention, relying on advanced technologies to sense their surroundings, exchange information with digital road-side infrastructure, make decisions, and control the vehicle. AVs use

Dynamically generated concatenated codes and their phase diagrams

April 24, 2025
Author(s)
Grace Sommers, David Huse, Michael Gullans
We formulate code concatenation as the action of a unitary quantum circuit on an expanding tree geometry and find that for certain classes of gates, applied identically at each node, a binary tree circuit encodes a single logical qubit with code distance

Ellipsometry in the EUV Regime

April 24, 2025
Author(s)
Aaron Chew, Bryan Barnes, Eric Shirley, Thomas Germer
We propose and analyze the sensitivity of an ellipsometer that uses extreme ultraviolet (EUV) light from the synchrotron SURF-III. The ellipsometer employs a four-mirror geometry to control polarization, as documented in the associated patent. With a

Lab-based multi-wavelength EUV diffractometry for critical dimension metrology

April 24, 2025
Author(s)
Bryan Barnes, Aaron Chew, Nicholas Jenkins, Yunzhe Shao, Martin Sohn, Regis Kline, Daniel Sunday, Purnima Balakrishnan, Thomas Germer, Steven Grantham, Clay Klein, Stephanie Moffitt, Eric Shirley, Henry Kapteyn, MARGARET MURNANE
Background: The industry is developing extreme-ultraviolet wavelength (EUV) techniques to measure critical dimensions (CDs) in logic fabrication. As nascent approaches are unveiled, evaluations against reference metrologies are essential to motivate

Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques

April 24, 2025
Author(s)
Alexandre Pereira, Simon Spindler, Zhitian Shi, Lucia Romano, Michal Rawlik, Federica Marone, Martin Stauber, Marco Stampanoni, Daniel Josell
The performance of an X-ray grating interferometry system depends on the geometry and quality of the gratings. Fabrication of micrometer-pitch high-aspect-ratio gold gratings, which are essential for measuring small refraction angles at higher energies, is

Enabling phase stabilization of quantum networks via displacement-enhanced photon counting

April 23, 2025
Author(s)
Jabir Marakkarakath Vadakkepurayil, Daehyun Ahn, Ivan Burenkov, Abdella Battou, Sergey Polyakov, N. Fajar R. Annafianto
Optical phase stabilization, tracking, and locking in long fiber links are pivotal for the functionality of many communication protocols and distributed sensors. However, conventional phase stabilization methods use strong optical probe signals that may

SysML Extension for Logistics Modeling and Analysis (SysLMA)

April 23, 2025
Author(s)
Raphael Barbau, Conrad Bock
Many engineers use analysis tools to predict behavior or find optimal values for properties of systems built to proposed designs, informing system design work by identifying cases where a design will perform incorrectly or in suboptimal ways. Design and

Measuring Out-of-Plane Permittivity of Thin Films to Millimeter Wave Frequencies

April 22, 2025
Author(s)
Florian Bergmann, Meagan Papac, Benjamin Jamroz, Nicholas Jungwirth, Bryan Bosworth, Anna Osella, Tomasz Karpisz, Lucas Enright, Eric Marksz, Angela Stelson, Christian Long, Nathan Orloff, Robert Jones
Modern microchips utilize multilayer stack-ups with many interstitial layers of dielectrics. Optimizing device performance and maximizing yield requires precise measurements of the out-of-plane permittivity of these dielectric layers. At the same time

Multi-technique reference measurement of critical dimension and shape for model validation in scanning electron microscopy

April 22, 2025
Author(s)
Wataru Yamane, Daron Westly, Glenn Holland, Yu Yamazawa, Naoto Ito, Andras Vladar, John Villarrubia
In semiconductor device manufacturing, 3D structure measurements of newly complex devices would be valuable alongside conventional scanning electron microscopy (SEM) and critical dimension SEM (CD-SEM) measurements. Since these applications in SEM directly

Sampling from exponential distributions in the time domain with superparamagnetic tunnel junctions

April 22, 2025
Author(s)
Temitayo Adeyeye, Sidra Gibeault, Daniel Lathrop, Matthew Daniels, Mark Stiles, Jabez McClelland, William Borders, Jason Ryan, Philippe Talatchian, Ursula Ebels, Advait Madhavan
Though exponential distributions are ubiquitous in statistical physics and related computational models, sampling them from device behavior is rarely done. The superparamagnetic tunnel junction (SMTJ), a key device in probabilistic computing, shows
Displaying 401 - 425 of 73812
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